Microelectromechanical systems device having a mechanically robust anti-stiction/outgassing structure

ABSTRACT

Various embodiments of the present disclosure are directed towards a microelectromechanical system (MEMS) device. The MEMS device includes a dielectric structure disposed over a first semiconductor substrate, where the dielectric structure at least partially defines a cavity. A second semiconductor substrate is disposed over the dielectric structure. The second semiconductor substrate includes a movable mass, where opposite sidewalls of the movable mass are disposed between opposite sidewall of the cavity. An anti-stiction structure is disposed between the movable mass and the dielectric structure, where the anti-stiction structure is a first silicon-based semiconductor.

BACKGROUND

Microelectromechanical systems (MEMS) devices are microscopic devicesthat integrate mechanical and electrical components to sense physicalquantities and/or to act upon surrounding environments. In recent years,MEMS devices have become increasingly common. For example, the use ofMEMS devices as sensing devices (e.g., motion sensing devices, pressuresensing devices, acceleration sensing devices, etc.) has becomewidespread in many of today's personal electronics (e.g., smart phones,fitness electronics, personal computing devices). MEMS devices are alsoused in other applications, such as vehicle applications (e.g., foraccident detection and airbag deployment systems), aerospaceapplications (e.g., for guidance systems), medical applications (e.g.,for patient monitoring), etc.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1 illustrates a cross-sectional view of some embodiments of amicroelectromechanical systems (MEMS) device having a mechanicallyrobust anti-stiction structure.

FIG. 2 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIG. 3 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIG. 4 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIG. 5 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIG. 6 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIG. 7 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIG. 8 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIG. 9 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIG. 10 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIGS. 11A-E illustrate various layout views of some embodiments of theanti-stiction structure of FIG. 1.

FIGS. 12A-C illustrate various simplified layout views of the MEMSdevice of FIG. 1.

FIGS. 13-27 illustrate a series of cross-sectional views of someembodiments for forming the MEMS device of FIG. 10.

FIG. 28 illustrates a flowchart of some embodiments of a method forforming a microelectromechanical systems (MEMS) device having amechanically robust anti-stiction structure.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

Many MEMS devices (e.g., accelerometers, gyroscopes, etc.) comprise amovable mass and a fixed electrode plate. The movable mass has a planarsurface aligned in parallel and spaced apart from an opposed planarsurface of the fixed electrode plate. In response to external stimuli(e.g., pressure, acceleration, gravity, etc.), the movable mass isdisplaced inside a cavity. This displacement changes a distance betweenthe movable mass and the fixed electrode plate. The change in distancemay be detected by a change in capacitive coupling between the movablemass and the fixed electrode and analyzed by appropriate electricalcircuits to derive a measurement of a physical quantity associated withthe change in distance, such as acceleration.

One of the design challenges with a MEMS device is to prevent themovable mass from sticking to adjacent parts of the MEMS device, aneffect known as stiction. One instances in which stiction occurs isduring normal operation of the MEMS device when the movable masssuddenly becomes “stuck” to a neighboring surface. The movable mass maybecome “stuck” to the neighboring surface due to any one of severaldifferent effects, such as capillary force, molecular van der Waalsforce, or electrostatic forces between neighboring surfaces. The extentto which these effects cause such stiction can vary based on manydifferent factors, such as temperature of the surfaces, contact areabetween the surfaces, contact potential difference between the surfaces,whether the surfaces are hydrophilic or hydrophobic, and so on.

One partial solution to limit such stiction is to utilize a bumperstructure disposed in the cavity. The bumper structure may limit suchstiction for any one of several, such as effectively reducing theoverall contact area between the movable mass and neighboring surfaces.The bumper structure is typically made of a material (e.g.,aluminum-copper (AlCu)) that has a relatively low yield stress (e.g.,less than or equal to about 1,000 megapascal (MPa). However, because thebumper structure is typically made of a material that has a relativelylow yield stress, relatively large impact forces from the movable massmay deform the bumper structure (e.g., plastic deformation). Theresulting deformation of the bumper structure may reduce theeffectiveness of the bumper structure in limiting future stiction (e.g.,due to the deformation increasing the overall contact area between themovable mass and the deformed bumper structure).

Various embodiments of the present application are directed toward aMEMS device having a mechanically robust anti-stiction structure. TheMEMS device includes an interlayer dielectric (ILD) structure that isdisposed over a first semiconductor substrate. An upper surface of theILD structure at least partially defines a bottom of a cavity. A secondsemiconductor substrate is disposed over the ILD structure and comprisesa movable mass. In response to external stimuli, the movable mass isconfigured to be displaced within the cavity. The anti-stictionstructure is disposed between the moveable mass and the upper surface ofthe ILD structure. The anti-stiction structure is a silicon-basedsemiconductor (e.g., polycrystalline silicon, monocrystalline silicon,amorphous silicon, etc.). Because the anti-stiction structure is asilicon-based semiconductor, the anti-stiction structure has arelatively high yield stress. Because the anti-stiction structure has arelatively high yield stress (e.g., between about 5,000 MPa and about9,000 MPa), relatively large impact forces from the movable mass may notdeform the anti-stiction structure (e.g., may not cause plasticdeformation of the anti-stiction structure). Accordingly, theanti-stiction structure may improve the mechanical robustness of theMEMS device, thereby expanding real-world applications (e.g.,high-impact resistant MEMS devices) and/or improving device performance(e.g., improving sensing performance over the lifetime of the MEMSdevice).

FIG. 1 illustrates a cross-sectional view of some embodiments of amicroelectromechanical systems (MEMS) device 100 having a mechanicallyrobust anti-stiction structure 132.

As shown in FIG. 1, the MEMS device 100 comprises a first semiconductorsubstrate 102. The first semiconductor substrate 102 may comprise anytype of semiconductor body (e.g., monocrystalline silicon/CMOS bulk,silicon-germanium (SiGe), silicon on insulator (SOI), etc.). One or moresemiconductor devices 104 may be disposed on/in the first semiconductorsubstrate 102. The one or more semiconductor devices 104 may be orcomprise, for example, metal-oxide-semiconductor (MOS) field-effecttransistors (FETs), some other MOS devices, or some other semiconductordevices. In some embodiments, the one or more semiconductor devices 104may be part of a sensing circuit 106. In further embodiments, the firstsemiconductor substrate 102 may be referred to as a complementarymetal-oxide-semiconductor (CMOS) substrate.

An interlayer dielectric (ILD) structure 108 is disposed over the firstsemiconductor substrate 102 and the one or more semiconductor devices104. An interconnect structure 110 (e.g., copper interconnect) isembedded in the ILD structure 108. The interconnect structure 110comprises a plurality of conductive features (e.g., metal lines, metalvias, metal contacts, etc.). In some embodiments, the ILD structure 108comprises one or more stacked ILD layers, which may respectivelycomprise a low-k dielectric (e.g., a dielectric material with adielectric constant less than about 3.9), an oxide (e.g., silicondioxide (SiO₂)), or the like. In further embodiments, the plurality ofconductive features may comprise, for example, copper (Cu), aluminum(Al), tungsten (W), titanium (Ti), titanium nitride (TiN),aluminum-copper (AlCu), some other conductive material, or a combinationof the foregoing. In yet further embodiments, the ILD structure 108 maybe referred to as a dielectric structure.

A second semiconductor substrate 112 is disposed over both the ILDstructure 108 and the first semiconductor substrate 102. The secondsemiconductor substrate 112 may comprise any type of semiconductor body(e.g., monocrystalline silicon/CMOS bulk, SiGe, SOI, etc.). In someembodiments, the second semiconductor substrate 112 may have a firstdoping type (e.g., p-type/n-type). In further embodiments, the secondsemiconductor substrate 112 may be referred to as a MEMS substrate.

In some embodiments, the second semiconductor substrate 112 is bonded tothe first semiconductor substrate 102 via a first bond structure 114(e.g., a eutectic bond structure). The first bond structure 114 maycomprise an upper bond ring 116 disposed on a lower bond ring 118. Insome embodiments, the first bond structure 114 is electricallyconductive. The lower bond ring 118 may comprise, for example, AlCu, Cu,Al, Ti, gold (Au), tin (Sn), some other bonding material, or acombination of the foregoing. The upper bond ring 116 may comprise, forexample, germanium (Ge), Cu, Al, Au, Sn, some other bonding material, ora combination of the foregoing.

In some embodiments, a third semiconductor substrate 120 is disposedover both the second semiconductor substrate 112 and the firstsemiconductor substrate 102. The third semiconductor substrate 120 maycomprise any type of semiconductor body (e.g., monocrystallinesilicon/CMOS bulk, SiGe, SOI, etc.). In further embodiments, the thirdsemiconductor substrate 120 may be referred to as a cap substrate. Insome embodiments, the third semiconductor substrate 120 is bonded to thesecond semiconductor substrate 112 via a second bond structure 122. Thesecond bond structure 122 may comprise, for example, Ge, SiO₂, Cu, Al,Au, Sn, Ti, some other bonding material, or a combination of theforegoing.

The ILD structure 108 at least partially defines a cavity 124. In someembodiments, the ILD structure 108, the second semiconductor substrate112, the first bond structure 114, the third semiconductor substrate120, and the second bond structure 122 at least partially define thecavity 124. In further embodiments, the third semiconductor substrate120 and the second bond structure 122 at least partially define an upperportion of the cavity 124, and the ILD structure 108 and the first bondstructure 114 at least partially define a lower portion of the cavity124.

The second semiconductor substrate 112 comprises a movable mass 126(e.g., proof mass). The movable mass 126 is a portion of the secondsemiconductor substrate 112 that is suspended in the cavity 124 by oneor more tethers. The movable mass 126 is configured to be displacedinside the cavity 124 in response to external stimuli (e.g., pressure,acceleration, gravity, etc.). In some embodiments, the movable mass 126may be electrically coupled to the sensing circuit 106 (e.g., via theinterconnect structure 110, the first bond structure 114, and a dopedconductive path disposed in the second semiconductor substrate 112 (notshown)).

A first sensing electrode 128 is disposed within the cavity 124. Thefirst sensing electrode 128 is electrically coupled to the interconnectstructure 110 via one or more upper conductive vias of a plurality ofupper conductive vias 130 (e.g., metal vias) of the interconnectstructure 110. In some embodiments, the plurality of upper conductivevias 130 of the interconnect structure 110 may be a plurality ofuppermost conductive vias of the interconnect structure 110. In furtherembodiments, the first sensing electrode 128 may be disposed within theILD structure 108. In yet further embodiments, the first sensingelectrode 128 may be a portion of an upper conductive line (e.g., uppermetal line) of the interconnect structure 110.

In some embodiments, the interconnect structure 110 electrically couplesthe first sensing electrode 128 to the sensing circuit 106. In furtherembodiments, the sensing circuit 106 is configured to measure andanalyze a change in capacitive coupling between the movable mass 126 andthe first sensing electrode 128 to derive a measurement of a physicalquantity (e.g., acceleration) associated with a change in distancebetween the movable mass 126 and the first sensing electrode 128. Insome embodiments, the first sensing electrode may comprise, for example,TiN, Cu, Al, W, AlCu, some other conductive material, or a combinationof the foregoing. In further embodiments, the first sensing electrode128 may have a same chemical composition as the lower bond ring 118.

An anti-stiction structure 132 is disposed in the cavity 124. Theanti-stiction structure 132 is disposed between the movable mass 126 andthe ILD structure 108. In some embodiments, the anti-stiction structure132 contacts the ILD structure 108. In further embodiments, theanti-stiction structure 132 is electrically conductive.

In some embodiments, the anti-stiction structure 132 comprises asemiconductor material (e.g., silicon (Si), Ge, etc.). The anti-stictionstructure 132 may be an undoped semiconductor (e.g., intrinsicsemiconductor) or a doped semiconductor (e.g., extrinsic semiconductor).In further embodiments, the anti-stiction structure 132 comprises ahigher concentration of first doping type dopants (e.g., n-type dopants)than second doping type dopants (e.g., p-type dopants), or vice versa.In further embodiments, the anti-stiction structure 132 has anelectrical resistivity less than or equal to about 100 ohm-centimeter(Ω·cm). In yet further embodiments, the electrical resistivity of theanti-stiction structure 132 is between about 0.5 milliohm-centimeter(m∩·cm) and about 100 Ω·cm.

In some embodiments, the anti-stiction structure 132 comprises silicon.In such embodiments, the anti-stiction structure 132 may be referred toas a silicon-based anti-stiction structure. In further embodiments, theanti-stiction structure 132 may consist essentially of silicon. It willbe appreciated that, in some embodiments, an anti-stiction structure 132consisting essentially of silicon may comprise first doping type dopantsand/or second doping type dopants. In further embodiments, theanti-stiction structure 132 may be a silicon-based semiconductor. Theanti-stiction structure 132 may be an amorphous solid (e.g., amorphoussilicon). In other embodiments, the anti-stiction structure 132 may be acrystalline solid (e.g., monocrystalline silicon, polycrystallinesilicon, etc.). In further embodiments, the anti-stiction structure 132may be a monocrystalline solid (e.g., monocrystalline silicon). In yetfurther embodiments, the anti-stiction structure 132 may be apolycrystalline solid (e.g., polycrystalline silicon).

In some embodiments, the anti-stiction structure 132 may have a yieldstress greater than or equal to 1,000 MPa. More specifically, theanti-stiction structure 132 may have a yield stress greater than orequal to 5,000 MPa. More specifically, the anti-stiction structure 132may have a yield stress between 5,000 MPa and 9,000 MPa. In someembodiments, the anti-stiction structure 132 has a different chemicalcomposition than the first sensing electrode 128. For example, theanti-stiction structure 132 may be silicon-based (e.g., monocrystallinesilicon, polycrystalline silicon, or amorphous silicon) and the firstsensing electrode 128 may be metal-based (e.g., TiN, W, AlCu, etc.). Infurther embodiments, the yield stress of the anti-stiction structure 132is greater than a yield stress of the first sensing electrode 128.

Because the anti-stiction structure 132 is a silicon-basedsemiconductor, the anti-stiction structure 132 has a relatively highyield stress. Because the anti-stiction structure has a relatively highyield stress, a relatively large impact force on the anti-stictionstructure (e.g., via the movable mass 126) may not deform theanti-stiction structure 132 (e.g., may not cause plastic deformation ofthe anti-stiction structure 132). Accordingly, the anti-stictionstructure 132 may improve the mechanical robustness of the MEMS device100, thereby expanding real-world applications (e.g., high-impactresistant MEMS devices) and/or improving device performance (e.g.,improving sensing performance over the lifetime of the MEMS device).

In some embodiments, the chemical composition of the anti-stictionstructure 132 is different than the chemical composition of the lowerbond ring 118. For example, the lower bond ring 118 may comprisetitanium and the anti-stiction structure 132 may be polycrystallinesilicon. In further embodiments, the chemical composition of theanti-stiction structure 132 is different than both the first sensingelectrode 128 and the lower bond ring 118.

FIG. 2 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

As shown in FIG. 2, the anti-stiction structure 132 is electricallycoupled to the interconnect structure 110. In some embodiments, theanti-stiction structure 132 is electrically coupled to one or more upperconductive vias of the plurality of upper conductive vias 130 (e.g., oneor more metal vias). The interconnect structure 110 may electricallycouple the anti-stiction structure 132 to the sensing circuit 106. Infurther embodiments, the sensing circuit 106 is configured to measureand analyze a change in capacitive coupling between the movable mass 126and the anti-stiction structure 132 to derive a measurement of aphysical quantity (e.g., acceleration) associated with a change indistance between the movable mass 126 and the anti-stiction structure132. In yet further embodiments, the interconnect structure 110 mayelectrically couple the anti-stiction structure to a specific electricalconnection (e.g., 5 volts, 0 volts, etc.)

Because the anti-stiction structure 132 is electrically conductive andis electrically coupled to the sensing circuit 106, the anti-stictionstructure 132 may be utilized as a sensing electrode. In suchembodiments, the anti-stiction structure 132 may be spaced from thefirst sensing electrode 128 and be utilized as a second sensingelectrode in conjunction with the first sensing electrode 128. Becausethe anti-stiction structure 132 may be utilized as a second sensingelectrode in conjunction with the first sensing electrode 128, theperformance of the MEMS device 100 may be improved (e.g., increasingsensitivity, improving accuracy, decreasing incorrect sensing errors,etc.). In other such embodiments, the anti-stiction structure 132 may beutilized as the first sensing electrode 128. In other words, theanti-stiction structure 132 and the first sensing electrode 128 may be asame structure. Because the anti-stiction structure 132 may be utilizedas the first sensing electrode 128, a cost to fabricate the MEMS device100 may be reduced (e.g., reducing a number ofphotolithography/deposition processes, reducing an amount of depositedmaterial, etc.).

Also shown in FIG. 2, the first sensing electrode 128 and theanti-stiction structure 132 may comprise a same material. For example,both the first sensing electrode 128 and the anti-stiction structure 132may comprise silicon. In further embodiments, both the first sensingelectrode 128 and the anti-stiction structure 132 may consistessentially of silicon. Because the first sensing electrode 128 and theanti-stiction structure 132 may comprise a same material, a cost tofabricate the MEMS device 100 may be reduced (e.g., reducing a number ofphotolithography/deposition processes). In some embodiments, thechemical composition of the first sensing electrode 128 is differentthan the chemical composition of the lower bond ring 118.

In some embodiments, both the first sensing electrode 128 and theanti-stiction structure 132 may be a silicon-based semiconductor. Inother embodiments, the anti-stiction structure 132 and the first sensingelectrode 128 may have a different chemical composition (e.g., Si andTiN, respectively). In further embodiments, the anti-stiction structure132 and the first sensing electrode 128 may have a same crystallinestructure. For example, both the anti-stiction structure 132 and thefirst sensing electrode 128 may be amorphous solid (e.g., amorphoussilicon), a crystalline solid (e.g., monocrystalline silicon,polycrystalline silicon, etc.), a monocrystalline solid (e.g.,monocrystalline silicon), or a polycrystalline solid (e.g.,polycrystalline silicon). Because the first sensing electrode 128 andthe anti-stiction structure 132 may have a same crystalline structure, acost to fabricate the MEMS device 100 may be reduced (e.g., reducing anumber of photolithography processes). In other embodiments, theanti-stiction structure 132 and the first sensing electrode 128 may havea different crystalline structure. For example, the anti-stictionstructure 132 may be a crystalline solid and the first sensing electrode128 may be an amorphous solid, or vice versa.

FIG. 3 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

As shown in FIG. 3, the anti-stiction structure 132 comprises one ormore outgassing species 302. In some embodiments, the outgassing speciesmay be, for example, argon (A), hydrogen (H), nitrogen (N), some otheroutgassing species, or a combination of the foregoing. The one or moreoutgassing species 302 are configured to increase a pressure inside thecavity 124 after the cavity 124 is sealed (or during sealing of thecavity 124). In such embodiments, the one or more outgassing species 302may increase the pressure inside the cavity 124 by outgassing from theanti-stiction structure 132 into the cavity 124. Because theanti-stiction structure 132 may comprise the one or more outgassingspecies 302, a cost to fabricate the MEMS device 100 may be reduced(e.g., reducing a number of photolithography/deposition/implantationprocesses to form a discrete outgassing structure). Further, because theanti-stiction structure 132 is a silicon-based semiconductor, theanti-stiction structure 132 may have improve outgassing properties overother materials (e.g., a silicon-based semiconductor outgassingstructure may provide more efficient outgassing of the one or moreoutgassing species 302 than a metal-based outgassing structure).

In some embodiments, the first sensing electrode 128 comprises the oneor more outgassing species 302. Because the first sensing electrode 128may comprise the one or more outgassing species 302, a cost to fabricatethe MEMS device 100 may be reduced (e.g., reducing a number ofphotolithography/deposition/implantation processes to form a discreteoutgassing structure). In further embodiments, both first sensingelectrode 128 and the anti-stiction structure 132 comprise the one ormore outgassing species 302. Because the anti-stiction structure 132 andthe first sensing electrode 128 may comprise the one or more outgassingspecies 302, the pressure inside the cavity 124 may be improved (e.g.,increased pressure, improved control over the pressure, etc.). The firstsensing electrode 128 and the anti-stiction structure 132 may comprisethe same one or more outgassing species 302 and/or a same concentrationof the one or more outgassing species 302. In other embodiments, thefirst sensing electrode 128 may comprise a first collection (orconcentration) of the one or more outgassing species 302 and theanti-stiction structure 132 may comprise a second collection (orconcentration) of the one or more outgassing species 302 different thanthe first collection (or concentration).

FIG. 4 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

As shown in FIG. 4, in some embodiments, the MEMS device 100 comprises aplurality of sensing electrodes 128 a-b. For example, the MEMS devicemay comprise a third sensing electrode 128 a and a fourth sensingelectrode 128 b. It will be appreciated that, in some embodiments, eachof the plurality of sensing electrodes 128 a-b may comprise the features(e.g., structural features, chemical composition, etc.) described forthe first sensing electrode 128, or vice versa. In some embodiments,upper surfaces of the plurality of sensing electrodes 128 a-b arecoplanar.

The third sensing electrode 128 a and the fourth sensing electrode 128 bmay have a same chemical composition. In other embodiments, the thirdsensing electrode 128 a has a different chemical composition than thefourth sensing electrode 128 b. In some embodiments, the third sensingelectrode 128 a and the fourth sensing electrode 128 b have a samecrystalline structure. In other embodiments, the third sensing electrode128 a and the fourth sensing electrode 128 b may have a differentcrystalline structure.

In some embodiments, the anti-stiction structure 132 may be disposed onthe fourth sensing electrode 128 b. It will be appreciated that, in someembodiments, the anti-stiction structure 132 may be disposed on thethird sensing electrode 128 a, or a plurality of anti-stictionstructures may be disposed on the plurality of sensing electrodes 128a-b, respectively. The anti-stiction structure 132 is disposed betweenthe movable element and the fourth sensing electrode 128 b. In someembodiments, the anti-stiction structure 132 has an upper surfacedisposed above an upper surface of the fourth sensing electrode 128 b.In further embodiments, opposite sidewalls of the anti-stictionstructure 132 are substantially aligned with opposite sidewalls of thefourth sensing electrode 128 b, respectively. In yet furtherembodiments, a thickness of the movable mass 126 is less thanthicknesses of adjacent portions of the second semiconductor substrate112. In such embodiments, the movable mass 126 may have a bottommostsurface disposed between a bottommost surface of the adjacent portionsof the second semiconductor substrate 112.

FIG. 5 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

In some embodiments, outermost sidewalls of the fourth sensing electrode128 b are disposed between outermost sidewalls of the anti-stictionstructure 132. In further embodiments, the anti-stiction structure 132may extend vertically along the outermost sidewalls of the fourthsensing electrode 128 b. In yet further embodiments, the anti-stictionstructure 132 may cover the upper surface of the fourth sensingelectrode 128 b and sidewalls of the fourth sensing electrode 128 b. Theanti-stiction structure 132 may contact both the ILD structure 108 andthe fourth sensing electrode 128 b.

FIG. 6 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

As shown in FIG. 6, in some embodiments, the MEMS device 100 comprises aplurality of anti-stiction structures 132 a-c. For example, the MEMSdevice may comprise a first anti-stiction structure 132 a, a secondanti-stiction structure 132 b, and a third anti-stiction structure 132 c(not shown in FIG. 6). It will be appreciated that, in some embodiments,each of the plurality of anti-stiction structures 132 a-c may comprisethe features (e.g., structural features, chemical composition, etc.)described for the anti-stiction structure 132, or vice versa. In someembodiments, the first anti-stiction structure 132 a and the secondanti-stiction structure 132 b have a same chemical composition. Infurther embodiments, the first anti-stiction structure 132 a and thesecond anti-stiction structure 132 b have a same crystalline structure.In other embodiments, the first anti-stiction structure 132 a and thesecond anti-stiction structure 132 b may have a different crystallinestructure.

In some embodiments, the first sensing electrode 128 is disposed betweentwo or more of the plurality of anti-stiction structures 132 a-c. Forexample, the first sensing electrode 128 may be disposed between thefirst anti-stiction structure 132 a and the second anti-stictionstructure 132 b. The plurality of anti-stiction structures 132 a-c mayhave upper surfaces that are coplanar with an upper surface of the firstsensing electrode 128.

FIG. 7 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

As shown in FIG. 7, the upper surfaces of the plurality of anti-stictionstructures 132 a-c are disposed below the upper surface of the firstsensing electrode 128. In some embodiments, the upper surfaces of theplurality of anti-stiction structures 132 a-c are disposed between theupper surface of the first sensing electrode 128 and a bottom surface ofthe first sensing electrode 128. In other embodiments, the uppersurfaces of the plurality of anti-stiction structures 132 a-c aredisposed below the bottom surface of the first sensing electrode 128. Infurther embodiments, the first sensing electrode 128 are disposed on afirst portion of the ILD structure 108 and the plurality ofanti-stiction structures 132 a-c may be disposed on a plurality ofsecond portions of the ILD structure 108. The first portion of the ILDstructure 108 may have an upper surface that is disposed above uppersurfaces of the plurality of second portions of the ILD structure 108.

FIG. 8 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

As shown in FIG. 8, the upper surfaces of the plurality of anti-stictionstructures 132 a-c are disposed above the upper surfaces of the firstsensing electrode 128. In some embodiments, the bottom surfaces of theplurality of anti-stiction structures 132 a-c are disposed above theupper surface of the first sensing electrode 128. In other embodiments,the bottom surfaces of the plurality of anti-stiction structures 132 a-care disposed between the upper surface of the first sensing electrode128 and the bottom surface of the first sensing electrode 128. Infurther embodiments, the upper surface of the first portion of the ILDstructure 108 is disposed below the upper surfaces of the plurality ofsecond portions of the ILD structure 108. In yet further embodiments,the upper surface of the first sensing electrode 128 is disposed belowan uppermost surface of the ILD structure 108. In other embodiments, theuppermost surface of the ILD structure 108 may be disposed between theupper surface of the first sensing electrode 128 and the bottom surfaceof the first sensing electrode 128.

FIG. 9 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

As shown in FIG. 9, the third anti-stiction structure 132 c extends intothe ILD structure 108. In some embodiments, a first upper surface of thethird anti-stiction structure 132 c is disposed below an upper surfaceof the ILD structure 108 and a second surface of the third anti-stictionstructure 132 c is disposed above the upper surface of the ILD structure108. In further embodiments, the third anti-stiction structure 132 cextend horizontally along the upper surface of the ILD structure 108.The third anti-stiction structure 132 c may have a bottom surfacedisposed below bottom surfaces of the first anti-stiction structure 132a, the second anti-stiction structure 132 b, and/or the first sensingelectrode 128. In yet further embodiments, the plurality ofanti-stiction structures 132 a-c are disposed on a first side of thefirst sensing electrode 128.

In some embodiments, an outgassing structure 902 is disposed in the ILDstructure 108. The outgassing structure 902 comprises the one or moreoutgassing species 302. In further embodiments, an upper surface of theoutgassing structure 902 is coplanar with the upper surface of the ILDstructure 108. The upper surface of the outgassing structure 902 may bedisposed below the upper surface of the first sensing electrode 128and/or one or more anti-stiction structures of the plurality ofanti-stiction structures 132 a-c. The upper surface of the outgassingstructure 902 may be disposed below a bottom surface of the firstsensing electrode 128 and/or one or more anti-stiction structures of theplurality of anti-stiction structures 132 a-c. In yet furtherembodiments, the outgassing structure 902 may be electrically coupled toone or more of the plurality of upper conductive vias 130.

In some embodiments, the outgassing structure 902 comprises asemiconductor material. The outgassing structure 902 may comprisesilicon. In such embodiments, the outgassing structure 902 may bereferred to as a silicon-based outgassing structure. The outgassingstructure 902 may consist essentially of silicon. In furtherembodiments, the outgassing structure 902 may be a silicon-basedsemiconductor. The outgassing structure 902 may be an amorphous solid.In other embodiments, the outgassing structure 902 may be a crystallinesolid. The outgassing structure 902 may be a monocrystalline solid. Theoutgassing structure 902 may be a polycrystalline solid. Because theoutgassing structure 902 is a silicon-based semiconductor, theoutgassing structure 902 may have improved outgassing properties overother materials (e.g., a silicon-based semiconductor outgassingstructure may provide more efficient outgassing of the one or moreoutgassing species 302 than a metal-based outgassing structure).

In some embodiments, the outgassing structure 902 and the plurality ofanti-stiction structures 132 a-c may have a same chemical composition.Because the outgassing structure 902 and the plurality of anti-stictionstructures 132 a-c may have a same chemical composition, a cost tofabricate the MEMS device 100 may be reduced (e.g., reducing a number ofphotolithography/deposition processes). In other embodiments, theoutgassing structure 902 has a different chemical composition than theplurality of anti-stiction structures 132 a-c. In further embodiments,the outgassing structure 902 and the plurality of anti-stictionstructures 132 a-c have a same crystalline structure. In otherembodiments, the outgassing structure 902 and the plurality ofanti-stiction structures 132 a-c may have a different crystallinestructure. In yet further embodiments, the outgassing structure 902 maybe disposed on a second side of the first sensing electrode 128 oppositethe first side of the first sensing electrode 128. In other embodiments,the outgassing structure 902 may be disposed on the first side of thefirst sensing electrode 128.

FIG. 10 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

As shown in FIG. 10, in some embodiments, the outgassing structure 902and the plurality of anti-stiction structures 132 a-c comprise the oneor more outgassing species 302. For example, the first anti-stictionstructure 132 a, the second anti-stiction structure 132 b, the thirdanti-stiction structure 132 c, and the outgassing structure 902 maycomprise the one or more outgassing species 302. In some embodiments,the outgassing structure 902 and the plurality of anti-stictionstructures 132 a-c may comprise the same one or more outgassing species302 and/or the same concentration of the one or more outgassing species302. In other embodiments, the outgassing structure 902 may comprise athird collection (or concentration) of the one or more outgassingspecies 302 and each of the plurality of anti-stiction structures 132a-c may comprise a fourth collection (or concentration) of the one ormore outgassing species 302 different than the third collection (orconcentration).

In some embodiments, the outgassing structure 902 may have an uppersurface disposed below an upper surface of the ILD structure 108. Infurther embodiments, the outgassing structure 902 may not beelectrically coupled to the interconnect structure 110. In suchembodiments, the ILD structure 108 may contact the entire bottom surfaceof the outgassing structure 902.

FIGS. 11A-E illustrate various layout views of some embodiments of theanti-stiction structure 132 of FIG. 1.

As shown in FIG. 11A, the anti-stiction structure 132 may have asquare-shaped layout. As shown in FIG. 11B, the anti-stiction structure132 may have a circular-shaped layout. As shown in FIG. 11C, theanti-stiction structure 132 may have a rectangular-shaped layout. Asshown in FIG. 11D, the anti-stiction structure 132 may have a generallyring-shaped layout (e.g., square-shaped ring, circular-shaped ring,rectangular-shaped ring, etc.). As shown in FIG. 11E, the anti-stictionstructure 132 may have a C-shaped layout. While FIGS. 11A-E illustratethe anti-stiction structure 132 having various geometrically-shapedlayouts, it will be appreciated the anti-stiction structure 132 may haveother geometrically-shaped layouts.

In some embodiments, the anti-stiction structure 132 may have a height(e.g., between an uppermost surface and a bottommost surface) betweenabout 0.1 micrometers (μm) and about 10 μm. In further embodiments, theanti-stiction structure 132 may have a width between about 1 μm andabout 100 μm. In further embodiments, the anti-stiction structure 132may have a length between about 1 μm and about 100 μm. In yet furtherembodiments, the anti-stiction structure 132 may be disposed within anarea having a length between about 1 μm and about 100 μm and a widthbetween about 1 μm and about 100 μm. It will be appreciated that theabove height range, width range, length range, and area range arenon-limiting examples, and depending on a size of the MEMS device 100and/or an application of the MEMS device 100, the height of theanti-stiction structure 132, the width of the anti-stiction structure132, the length of the anti-stiction structure 132, and/or the area inwhich the anti-stiction structure 132 is disposed may be outside theabove ranges (e.g., less than or greater than the above ranges).

FIGS. 12A-C illustrate various simplified layout views of the MEMSdevice 100 of FIG. 1. FIGS. 12A-C are “simplified” because the thirdsemiconductor substrate 120 is not shown, the second bond structure 122is not shown, the second semiconductor substrate 112 is not shown, thefirst bond structure 114 is not shown, the interconnect structure 110 isnot shown, the first sensing electrode 128 is not shown, a perimeter ofthe cavity 124 is illustrated by a first dashed line, and a perimeter ofthe movable mass 126 is illustrated by a second dashed line.

As shown in FIG. 12A, in some embodiments, the MEMS device 100 may onlycomprise a single anti-stiction structure 132. In further embodiments, alayout of the anti-stiction structure 132 may be vertically aligned withthe perimeter of the movable mass 126. For example, the anti-stictionstructure 132 may be disposed on the ILD structure 108, such that edgesof the movable mass 126 are disposed between inner sidewalls and outersidewalls of the anti-stiction structure 132. It other embodiments, theanti-stiction structure 132 may be disposed inside the perimeter of themovable mass 126 or outside the perimeter of the movable mass 126.

As shown in FIG. 12B, in some embodiments, the MEMS device 100 maycomprise the plurality of anti-stiction structures 132 a-c. In someembodiments, each of the plurality of anti-stiction structures 132 a-cmay have a same geometrically-shaped layout (e.g., a rectangular-shapedlayout). The plurality of anti-stiction structures 132 a-c may bevertically aligned with the perimeter of the movable mass 126. In otherembodiments, the plurality of anti-stiction structures 132 a-c may bedisposed inside the perimeter of the movable mass 126 or outside theperimeter of the movable mass 126. In some embodiments, some of theanti-stiction structures of the plurality of anti-stiction structures132 a-c may be vertically aligned with the perimeter of the movable mass126, and some other of the plurality of anti-stiction structures 132 a-cmay be disposed inside the perimeter of the movable mass 126 and/oroutside the perimeter of the movable mass 126. For example, the firstanti-stiction structure 132 a and the second anti-stiction structure 132b may be vertically aligned with the perimeter of the movable mass 126,and the third anti-stiction structure 132 c may be disposed inside theperimeter of the movable mass 126 (or outside the perimeter of themovable mass 126).

As shown in FIG. 12C, some of the plurality of anti-stiction structures132 a-c may have a different geometrically-shaped layout than some otherof the plurality of anti-stiction structures 132 a-c. For example, thefirst anti-stiction structure 132 a may have a firstgeometrically-shaped layout (e.g., circular-shaped layout), the secondanti-stiction structure 132 b may have a second geometrically-shapedlayout (e.g., square-shaped ring layout) different than the firstgeometrically-shaped layout, and the third anti-stiction structure 132 cmay have a third geometrically-shaped layout (e.g., C-shaped layout)different than the first geometrically-shaped layout and the secondgeometrically-shaped layout.

FIGS. 13-27 illustrate a series of cross-sectional views of someembodiments for forming the MEMS device 100 of FIG. 10.

As shown in FIG. 13, an interlayer dielectric (ILD) structure 108 isdisposed over a first semiconductor substrate 102. An interconnectstructure 110 is disposed in the ILD structure 108. Further, theinterconnect structure 110 comprises a plurality of upper conductivevias 130. Moreover, one or more semiconductor devices 104 are disposedon/in the first semiconductor substrate 102.

In some embodiments, a method for forming the structure illustrated inFIG. 13 comprises forming the one or more semiconductor devices 104 byforming pairs of source/drain regions in the first semiconductorsubstrate 102 (e.g., via ion implantation). Thereafter, gate dielectricsand gate electrodes are formed over the first semiconductor substrate102 and between the pairs of source/drain regions (e.g., viadeposition/growth processes and etching processes). A first ILD layer isthen formed over the one or more semiconductor devices 104, and contactopenings are formed in the first ILD. A conductive material (e.g., W) isformed on the first ILD layer and in the contact openings. Thereafter, aplanarization process (e.g., chemical-mechanical polishing (CMP)) isperformed into the conductive material to form conductive contacts(e.g., metal contacts) in the first ILD layer.

A second ILD layer is then formed over the first ILD layer and theconductive contacts, and first conductive line trenches are formed inthe second ILD layer. A conductive material (e.g., Cu) is formed on thesecond ILD layer and in the first conductive line trenches. Thereafter,a planarization process (e.g., CMP) is performed into the conductivematerial to form a conductive line (e.g., metal 1) in the second ILD. Athird ILD layer is then formed over the second ILD layer and theconductive line, and conductive via openings are formed in the third ILDlayer. A conductive material (e.g., Cu) is formed on the third ILD layerand in the conductive via openings. Thereafter, a planarization process(e.g., CMP) is performed into the conductive material to form conductivevias (e.g., metal vias) in the third ILD. The above processes forforming the conductive line and the conductive vias may be repeated anynumber of times to form the interconnect structure 110. In someembodiments, formation of the plurality of upper conductive vias 130(e.g., via the above process for forming conductive vias) completesformation of the interconnect structure 110. In other embodiments,formation of an upper conductive line (e.g., top metal) completesformation of the interconnect structure 110. In further embodiments, theabove layers and/or structures may be formed using a deposition orgrowth process, such as chemical vapor deposition (CVD), physical vapordeposition (PVD), atomic layer deposition (ALD), thermal oxidation,sputtering, electrochemical plating, electroless plating, some otherdeposition or growth process, or a combination of the foregoing.

As shown in FIG. 14, a first opening 1402 is formed in the ILD structure108. In some embodiments, a process for forming the first opening 1402comprises forming a patterned masking layer (not shown) (e.g.,negative/positive photoresist) on the ILD structure 108 and the upperconductive vias 130 (e.g., via a deposition process and photolithographyprocess). Thereafter, the ILD structure 108 is exposed to an etchant(e.g., wet/dry etchant) to remove unmasked portions of the ILD structure108, thereby forming the first opening 1402.

As shown in FIG. 15, an outgassing layer 1502 is formed on the ILDstructure 108, on the plurality of upper conductive vias 130, and in thefirst opening 1402 (see, e.g., FIG. 14). The outgassing layer 1502comprises one or more outgassing species 302. The outgassing species maybe, for example, argon (A), hydrogen (H), nitrogen (N), some otheroutgassing species, or a combination of the foregoing. In furtherembodiments, the outgassing layer 1502 comprises a semiconductormaterial. The outgassing layer 1502 may comprise silicon. In suchembodiments, the outgassing layer 1502 may be referred to as asilicon-based outgassing layer. The outgassing layer 1502 may consistessentially of silicon. In yet further embodiments, the outgassing layer1502 may be a silicon-based semiconductor. The outgassing layer 1502 maybe an amorphous solid. In other embodiments, the outgassing layer 1502may be a crystalline solid. The outgassing layer 1502 may be amonocrystalline solid. The outgassing layer 1502 may be apolycrystalline solid.

In some embodiments, a process for forming the outgassing layer 1502comprises depositing the outgassing layer 1502 on the ILD structure 108,on the plurality of upper conductive vias 130, and in the first opening1402. The outgassing layer 1502 may be deposited by, for example,sputtering, CVD, PVD, ALD, some other deposition process, or acombination of the foregoing. In further embodiments, the one or moreoutgassing species 302 are formed in the outgassing layer 1502 during(or after) formation of the outgassing layer 1502. For example, the oneor more outgassing species 302 may be pumped into a processing chamberduring deposition of the outgassing layer 1502, thereby forming theoutgassing layer 1502 with the one or more outgassing species 302 in theoutgassing layer 1502.

As shown in FIG. 16, an outgassing structure 902 is formed in the ILDstructure 108. In some embodiments, the outgassing structure 902 isformed with an upper surface that is coplanar with an upper surface ofthe ILD structure 108. In some embodiments, a process for forming theoutgassing structure 902 comprises performing a planarization process1602 (e.g., CMP) on the outgassing layer 1502 (see, e.g., FIG. 15) toremove an upper portion of the outgassing layer 1502, thereby formingthe outgassing structure 902. In yet further embodiments, theplanarization process 1602 may be performed on the outgassing layer 1502and the ILD structure 108 to co-planarize upper surfaces of theoutgassing structure 902 and the ILD structure 108. In some embodiments,the process to form the outgassing structure 902 may be referred to as adamascene formation process.

As shown in FIG. 17, a first sensing electrode 128 and a lower bond ring118 are formed over the ILD structure 108. In some embodiments, aprocess for forming the first sensing electrode 128 and the lower bondring 118 comprises depositing a conductive layer (not shown) on the ILDstructure 108, the outgassing structure 902, and the plurality of upperconductive vias 130. The conductive layer may be deposited by, forexample, CVD, PVD, ALD, sputtering, electrochemical plating, electrolessplating, donor wafer bonding deposition (e.g., bonding a single crystalsilicon SOI wafer to the ILD structure 108), some other depositionprocess, or a combination of the foregoing. A patterned masking layer(not shown) is then formed on the conductive layer. Thereafter, theconductive layer is exposed to an etchant to remove unmasked portions ofthe conductive layer, thereby forming the first sensing electrode 128and the lower bond ring 118. Subsequently, in some embodiments, thepatterned masking layer is stripped away.

It will be appreciated that a plurality of conductive layers, aplurality of patterned masking layers, and a plurality of etchingprocess (e.g., exposing a layer to an etchant) may be utilized to formthe first sensing electrode 128 and the lower bond ring 118. Forexample, a first conductive layer (e.g., Si) may be deposited on the ILDstructure 108, the outgassing structure 902, and the plurality of upperconductive vias 130. In some embodiments, the first conductive layer maybe formed with the one or more outgassing species 302 in the firstlayer. A first patterned masking layer is then formed on the firstconductive layer. Thereafter, the first conductive layer is exposed to afirst etchant to remove unmasked portions of the first conductive layer,thereby forming the first sensing electrode 128. Subsequently, in someembodiments, the first patterned masking layer is stripped away.

A second conductive layer (e.g., TiN) is then deposited on the ILDstructure 108, the outgassing structure 902, the plurality of upperconductive vias 130, and the first sensing electrode 128. A secondpatterned masking layer is then formed on the second conductive layer.Thereafter, the second conductive layer is exposed to a second etchantto remove unmasked portions of the second conductive layer, therebyforming the lower bond ring 118. Subsequently, in some embodiments, thesecond patterned masking layer is stripped away. It will be appreciatedthat, in some embodiments, the lower bond ring 118 may be formed beforethe first sensing electrode 128.

As shown in FIG. 18, a second opening 1802 is formed in the ILDstructure 108. In some embodiments, a process for forming the secondopening 1802 comprises forming a patterned masking layer (not shown) onthe ILD structure 108, the outgassing structure 902, the first sensingelectrode 128, the lower bond ring 118, and the upper conductive vias130. Thereafter, the ILD structure 108 is exposed to an etchant toremove unmasked portions of the ILD structure 108 and unmasked portionsof the plurality of upper conductive vias 130, thereby forming thesecond opening 1802.

It will be appreciated that, in some embodiments, the ILD structure 108may comprise a plurality of ILD layers in which one or more of theplurality of upper conductive vias 130 are disposed. For example, afirst upper conductive via of the plurality of upper conductive vias 130may be disposed in a first ILD layer. The first upper conductive via hasa first height. A second ILD layer may be disposed on the first ILDlayer and the first upper conductive via. A second upper conductive viaof the plurality of upper conductive vias 130 may be disposed in boththe first ILD layer and the second ILD layer. The second upperconductive via has a second height greater than the first height. Infurther embodiments, the second opening 1802 may be formed over thefirst upper conductive via and in the second ILD layer.

As shown in FIG. 19, an anti-stiction layer 1902 is formed over the ILDstructure 108, the first sensing electrode 128, the lower bond ring 118,the outgassing structure 902, and the plurality of upper conductive vias130. The anti-stiction layer 1902 comprises a semiconductor material.The anti-stiction layer 1902 may comprise silicon. In such embodiments,the anti-stiction layer 1902 may be referred to as a silicon-basedanti-stiction layer. The anti-stiction layer 1902 may consistessentially of silicon. In yet further embodiments, the anti-stictionlayer 1902 may be a silicon-based semiconductor. The anti-stiction layer1902 may be an amorphous solid. In other embodiments, the anti-stictionlayer 1902 may be a crystalline solid. The anti-stiction layer 1902 maybe a monocrystalline solid. The anti-stiction layer 1902 may be apolycrystalline solid.

In some embodiments, the anti-stiction layer 1902 and the first sensingelectrode 128 may be a silicon-based semiconductor. In otherembodiments, the anti-stiction layer 1902 and the first sensingelectrode 128 may have a different chemical composition (e.g., Si andTiN, respectively). In some embodiments, the anti-stiction layer 1902and the first sensing electrode 128 may have a same crystallinestructure. For example, both the anti-stiction layer 1902 and the firstsensing electrode 128 may be an amorphous solid (e.g., amorphoussilicon), a crystalline solid (e.g., monocrystalline silicon,polycrystalline silicon, etc.), a monocrystalline solid (e.g.,monocrystalline silicon), or a polycrystalline solid (e.g.,polycrystalline silicon). In other embodiments, the anti-stiction layer1902 and the first sensing electrode 128 may have a differentcrystalline structure. For example, the anti-stiction layer 1902 may bea crystalline solid and the first sensing electrode 128 may be anamorphous solid, or vice versa.

In some embodiments, the anti-stiction layer 1902 may comprise one ormore outgassing species 302. The first sensing electrode 128 and theanti-stiction layer 1902 may comprise the same one or more outgassingspecies 302 and/or same concentration of the one or more outgassingspecies 302. In other embodiments, the first sensing electrode 128 maycomprise a first collection (or concentration) of the one or moreoutgassing species 302, and the anti-stiction layer 1902 may comprise asecond collection (or concentration) of the one or more outgassingspecies 302 different than the first collection (or concentration).

In some embodiments, a process for forming the anti-stiction layer 1902comprises depositing the anti-stiction layer 1902 on the ILD structure108, on the lower bond ring 118, on the first sensing electrode 128, onthe outgassing structure 902, on the plurality of upper conductive vias130, and lining the second opening 1802 (see, e.g., FIG. 18). Theanti-stiction layer 1902 may be deposited by, for example, CVD, PVD,ALD, sputtering, donor wafer bonding deposition, some other depositionprocess, or a combination of the foregoing. In further embodiments, theone or more outgassing species 302 are formed in the anti-stiction layer1902 during (or after) formation of the anti-stiction layer 1902. Forexample, the one or more outgassing species 302 may be pumped into aprocessing chamber during deposition of the anti-stiction layer 1902,thereby forming the anti-stiction layer 1902 with the one or moreoutgassing species 302 in the anti-stiction layer 1902.

As shown in FIG. 20, a plurality of anti-stiction structures 132 a-c areformed over/in the ILD structure 108. In some embodiments, a process forforming the plurality of anti-stiction structures 132 a-c comprisesdepositing a patterned masking layer (not shown) on the anti-stictionlayer 1902 (see, e.g., FIG. 19). Thereafter, an etching process 2002 isperformed on the anti-stiction layer 1902 with the patterned maskinglayer in place. The etching process 2002 comprises exposing theanti-stiction layer 1902 to an etchant to remove unmasked portions ofanti-stiction layer 1902, thereby forming the plurality of anti-stictionstructures 132 a-c. Subsequently, in some embodiments, the patternedmasking layer is stripped away. In further embodiments, the etchingprocess 2002 may remove an upper portion of the outgassing structure902, such that the upper surface of the outgassing structure 902 isdisposed below the upper surface of the ILD structure 108. It will beappreciated that, in some embodiments, the first sensing electrode 128and the plurality of anti-stiction structures 132 a-c may be formed by asame process (e.g., an embodiment in which the first sensing electrode128 and the plurality of anti-stiction structures 132 a-c are both asilicon-based semiconductor). In yet further embodiments, the processfor forming the plurality of anti-stiction structures 132 a-c isreferred to as a layout patterning formation process.

As shown in FIG. 21, a plurality of third openings 2102 are formed in athird semiconductor substrate 120. In some embodiments, a process forforming the plurality of third openings 2102 comprises forming apatterned masking layer (not shown) on the third semiconductor substrate120. Thereafter, the third semiconductor substrate 120 is exposed to anetchant to remove unmasked portions of the third semiconductor substrate120, thereby forming the plurality of third openings 2102. Subsequently,in some embodiments, the patterned masking layer is stripped away.

As shown in FIG. 22, a second bond structure 122 is formed on the thirdsemiconductor substrate 120. In some embodiments, a process for formingthe second bond structure comprises depositing or growing a first bondlayer (not shown) on the third semiconductor substrate 120 and liningthe plurality of third openings 2102. A patterned masking layer (notshown) is then formed on the first bond layer. Thereafter, the firstbond layer is exposed to an etchant to remove unmasked portions of firstbond layer, thereby forming the second bond structure 122. Subsequently,in some embodiments, the patterned masking layer is stripped away. Insome embodiments, the first bond layer may be deposited or grown by, forexample, CVD, PVD, ALD, thermal oxidation, sputtering, an epitaxyprocess, electrochemical plating, electroless plating, some otherdeposition or growth process, or a combination of the foregoing. Infurther embodiments, the first bond layer may comprise, for example, Ge,SiO₂, Cu, Al, Au, Sn, Ti, some other bonding material, or a combinationof the foregoing. It will be appreciated that, in some embodiments, thesecond bond structure 122 may be formed before the plurality of thirdopenings 2102 are formed.

As shown in FIG. 23, a second semiconductor substrate 112 is bonded tothe third semiconductor substrate 120. In some embodiments, the secondsemiconductor substrate 112 is bonded to the third semiconductorsubstrate 120 via the second bond structure 122. In further embodiments,a process for bonding the second semiconductor substrate 112 to thethird semiconductor substrate 120 comprises positioning the secondsemiconductor substrate 112 so that the second semiconductor substrate112 is aligned with the third semiconductor substrate 120 and faces thesecond bond structure 122. Thereafter, the second semiconductorsubstrate 112 is bonded to the second bond structure 122 (e.g., via adirect bonding process), thereby bonding the second semiconductorsubstrate 112 to the third semiconductor substrate 120. It will beappreciated that, in some embodiments, the second semiconductorsubstrate 112 may be bonded to the third semiconductor substrate 120 bya different bonding process (e.g., a hybrid boning process, a eutecticbonding process, etc.).

As shown in FIG. 24, a fourth opening 2402 is formed in the secondsemiconductor substrate 112. The fourth opening 2402 reduces a thicknessof a portion of the second semiconductor substrate 112. In someembodiments, a process for forming the fourth opening 2402 comprisesforming a patterned masking layer (not shown) on the secondsemiconductor substrate 112. Thereafter, the second semiconductorsubstrate 112 is exposed to an etchant to remove unmasked portions ofthe second semiconductor substrate 112, thereby forming the fourthopening 2402. Subsequently, in some embodiments, the patterned maskinglayer is stripped away.

As shown in FIG. 25, an upper bond ring 116 is formed on the secondsemiconductor substrate 112. In some embodiments, the upper bond ring116 is formed laterally surrounding the fourth opening 2402. In furtherembodiments, a process for forming the upper bond ring 116 comprisesdepositing or growing a second bond layer (not shown) on the secondsemiconductor substrate 112 and lining the fourth opening 2402. Apatterned masking layer (not shown) is then formed on the second bondlayer. Thereafter, the second bond layer is exposed to an etchant toremove unmasked portions of second bond layer, thereby forming the upperbond ring 116. Subsequently, in some embodiments, the patterned maskinglayer is stripped away. In further embodiments, the second bond layermay be deposited or grown by, for example, CVD, PVD, ALD, thermaloxidation, sputtering, an epitaxy process, electrochemical plating,electroless plating, some other deposition or growth process, or acombination of the foregoing. In yet further embodiments, the secondbond layer may comprise, for example, Ge, Cu, Al, Au, Sn, some otherbonding material, or a combination of the foregoing. It will beappreciated that, in some embodiments, the upper bond ring 116 may beformed before the fourth opening 2402 is formed.

As shown in FIG. 26, a movable mass 126 is formed in the secondsemiconductor substrate 112. In some embodiments, a process for formingthe movable mass 126 comprises forming a patterned masking layer (notshown) on the second semiconductor substrate 112 and the upper bond ring116, and lining the fourth opening 2402 (see, e.g., FIG. 24).Thereafter, the second semiconductor substrate 112 is exposed to anetchant to remove unmasked portions of the second semiconductorsubstrate 112, thereby forming the movable mass 126. Subsequently, insome embodiments, the patterned masking layer is stripped away.

As shown in FIG. 27, both the second semiconductor substrate 112 and thethird semiconductor substrate 120 are bonded to the first semiconductorsubstrate 102. In some embodiments, the second semiconductor substrate112 and the third semiconductor substrate 120 are bonded to the firstsemiconductor substrate 102 via the upper bond ring 116 and the lowerbond ring 118. In further embodiments, a process for bonding the secondsemiconductor substrate 112 and the third semiconductor substrate 120 tothe first semiconductor substrate 102 comprises positioning the secondsemiconductor substrate 112 and the third semiconductor substrate 120 sothat the upper bond ring 116 is aligned with and facing the lower bondring 118. Thereafter, the upper bond ring 116 is bonded to the lowerbond ring 118 (e.g., via a eutectic bonding process), thereby bondingthe second semiconductor substrate 112 and the third semiconductorsubstrate 120 to the first semiconductor substrate 102. It will beappreciated that, in some embodiments, the second semiconductorsubstrate 112 and the third semiconductor substrate 120 may be bonded tothe first semiconductor substrate 102 by a different bonding process(e.g., a hybrid boning process, a eutectic bonding process, etc.).

In some embodiments, bonding the upper bond ring 116 to the lower bondring 118, forms a first bond structure 114 that laterally surrounds themovable mass 126. In further embodiments, bonding the secondsemiconductor substrate 112 and the third semiconductor substrate 120 tothe first semiconductor substrate 102, forms a cavity 124 in which themovable mass 126 is disposed. In further embodiments, after the secondsemiconductor substrate 112 and the third semiconductor substrate 120are bonded to the first semiconductor substrate 102, the one or moreoutgassing species 302 are outgassed into the cavity 124 (e.g., byheating the MEMS device 100 to an outgassing temperature). In yetfurther embodiments, after the second semiconductor substrate 112 andthe third semiconductor substrate 120 are bonded to the firstsemiconductor substrate 102, formation of the MEMS device 100 iscomplete.

FIG. 28 illustrates a flowchart of some embodiments of a method forforming a microelectromechanical systems (MEMS) device having amechanically robust anti-stiction structure. While the flowchart 2800 ofFIG. 28 is illustrated and described herein as a series of acts orevents, it will be appreciated that the illustrated ordering of suchacts or events is not to be interpreted in a limiting sense. Forexample, some acts may occur in different orders and/or concurrentlywith other acts or events apart from those illustrated and/or describedherein. Further, not all illustrated acts may be required to implementone or more aspects or embodiments of the description herein, and one ormore of the acts depicted herein may be carried out in one or moreseparate acts and/or phases.

At act 2802, a sensing electrode is formed on/in an interlayerdielectric (ILD) structure, wherein the ILD structure is disposed over afirst semiconductor substrate. FIG. 17 illustrates a cross-sectionalview of some embodiments corresponding to act 2802. In some embodiments,an outgassing structure may be formed in the ILD structure before (orafter) the sensing electrode is formed. FIGS. 13-16 illustrate a seriesof cross-sectional views of some embodiments for forming the outgassingstructure.

At act 2804, one or more anti-stiction structures are formed over/in theILD structure, wherein the one or more anti-stiction structures aresilicon-based semiconductors. FIGS. 18-20 illustrate a series ofcross-sectional views of some embodiments corresponding to act 2804.

At act 2806, a second semiconductor is bonded to a third semiconductorsubstrate. FIGS. 21-25 illustrate a series of cross-sectional views ofsome embodiments corresponding to act 2806.

At act 2808, a movable mass is formed in the second semiconductorsubstrate. FIG. 26 illustrates a cross-sectional view of someembodiments corresponding to act 2808.

At act 2810, both the second semiconductor substrate and the thirdsemiconductor substrate are bonded to the first semiconductor substrate.FIG. 27 illustrates a cross-sectional view of some embodimentscorresponding to act 2810.

In some embodiments, the present application provides amicroelectromechanical system (MEMS) device. The MEMS device comprises adielectric structure disposed over a first semiconductor substrate,wherein the dielectric structure at least partially defines a cavity. Asecond semiconductor substrate is disposed over the dielectricstructure. The second semiconductor substrate comprises a movable mass,wherein opposite sidewalls of the movable mass are disposed betweenopposite sidewall of the cavity. An anti-stiction structure is disposedbetween the movable mass and the dielectric structure, wherein theanti-stiction structure is a first silicon-based semiconductor.

In some embodiments, the present application provides amicroelectromechanical system (MEMS) device. The MEMS device comprises asensing circuit disposed on a first semiconductor substrate. Aninterlayer dielectric (ILD) structure is disposed over the firstsemiconductor substrate and the sensing circuit, wherein the ILDstructure at least partially defines a cavity. An interconnect structureis embedded in the ILD structure, wherein the interconnect structure iselectrically coupled to the sensing circuit. A second semiconductorsubstrate is disposed over the ILD structure. The second semiconductorsubstrate comprises a movable mass, wherein opposite sidewalls of themovable mass are disposed between opposite sidewall of the cavity. Ananti-stiction structure is disposed between the movable mass and the ILDstructure, wherein the anti-stiction structure is a silicon-basedsemiconductor and is electrically coupled to the interconnect structure,and wherein the sensing circuit is configured to measure a change incapacitive coupling between the movable mass and the anti-stictionstructure.

In some embodiments, the present application provides a method forforming a microelectromechanical system (MEMS) device. The methodcomprises forming a sensing electrode over an interlayer dielectric(ILD) structure, wherein the ILD structure is disposed over a firstsemiconductor substrate. An anti-stiction structure is formed over theILD structure, wherein the anti-stiction structure is a silicon-basedsemiconductor. A second semiconductor substrate is bonded to a thirdsemiconductor substrate. A movable mass is formed in the secondsemiconductor substrate. After the second semiconductor substrate andthe third semiconductor substrate are bonded together, the secondsemiconductor substrate and the third semiconductor substrate are bondedto the first semiconductor substrate

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. A microelectromechanical system (MEMS) device,comprising: a dielectric structure disposed over a first semiconductorsubstrate, wherein the dielectric structure at least partially defines acavity; a second semiconductor substrate disposed over the dielectricstructure and comprising a movable mass, wherein opposite sidewalls ofthe movable mass are disposed between opposite sidewalls of the cavity;an anti-stiction structure disposed between the movable mass and thedielectric structure, wherein the anti-stiction structure is a firstsilicon-based semiconductor; and an electrode disposed between themovable mass and the dielectric structure, wherein the electrode is asecond silicon-based semiconductor, and wherein both the electrode andthe anti-stiction structure are amorphous solids.
 2. The MEMS device ofclaim 1, further comprising: an interconnect structure disposed in thedielectric structure, wherein the anti-stiction structure iselectrically coupled to the interconnect structure.
 3. The MEMS deviceof claim 1, wherein an electrical resistivity of the anti-stictionstructure is between about 0.5 milliohm-centimeter (mΩ·cm) and about 100ohm-centimeter (Ω·cm).
 4. The MEMS device of claim 1, wherein theanti-stiction structure comprises one or more outgassing species.
 5. TheMEMS device of claim 1, wherein an uppermost surface of theanti-stiction structure is disposed below an uppermost surface of theelectrode.
 6. The MEMS device of claim 1, wherein an uppermost surfaceof the anti-stiction structure is disposed over an uppermost surface ofthe electrode.
 7. The MEMS device of claim 1, wherein an uppermostsurface of the anti-stiction structure is co-planar with an uppermostsurface of the electrode.
 8. The MEMS device of claim 1, wherein theanti-stiction structure is partially embedded below an uppermost surfaceof the dielectric structure and partially disposed over the uppermostsurface of the dielectric structure.
 9. The MEMS device of claim 8,wherein the anti-stiction structure has a first upper surface disposedbelow the uppermost surface of the dielectric structure and a secondupper surface disposed over the uppermost surface of the dielectricstructure.
 10. A microelectromechanical system (MEMS) device,comprising: a sensing circuit disposed on a first semiconductorsubstrate; an interlayer dielectric (ILD) structure disposed over thefirst semiconductor substrate and the sensing circuit, wherein the ILDstructure at least partially defines a cavity; an interconnect structureembedded in the ILD structure, wherein the interconnect structure iselectrically coupled to the sensing circuit; a second semiconductorsubstrate disposed over the ILD structure and comprising a movable mass,wherein opposite sidewalls of the movable mass are disposed betweenopposite sidewalls of the cavity; an anti-stiction structure disposedbetween the movable mass and the ILD structure, wherein theanti-stiction structure is a silicon-based semiconductor and iselectrically coupled to the interconnect structure, and wherein thesensing circuit is configured to measure a change in capacitive couplingbetween the movable mass and the anti-stiction structure, wherein theanti-stiction structure comprises one or more outgassing species; and asilicon-based outgassing structure disposed between the movable mass andthe ILD structure, wherein the silicon-based outgassing structure isspaced from the anti-stiction structure.
 11. The MEMS device of claim10, wherein the anti-stiction structure has a first upper surfacedisposed below an uppermost surface of the ILD structure, and a secondupper surface disposed over the uppermost surface of the ILD structure.12. The MEMS device of claim 10, wherein an uppermost surface of thesilicon-based outgassing structure is co-planar with an uppermostsurface of the ILD structure, and wherein an uppermost surface of theanti-stiction structure is disposed over the uppermost surface of thesilicon-based outgassing structure.
 13. The MEMS device of claim 10,further comprising: an electrode disposed between the movable mass andthe ILD structure, wherein the electrode is disposed vertically betweenthe anti-stiction structure and the ILD structure, and the electrodecontacts both the ILD structure and the anti-stiction structure.
 14. TheMEMS device of claim 13, wherein the anti-stiction structure has a yieldstress greater than a yield stress of the electrode.
 15. The MEMS deviceof claim 14, wherein opposite sidewalls of the anti-stiction structureare substantially aligned with opposite sidewalls of the electrode,respectively.
 16. The MEMS device of claim 15, wherein: the electrodehas a first chemical composition; and the anti-stiction structure has asecond chemical composition different than the first chemicalcomposition.
 17. The MEMS device of claim 10, wherein the anti-stictionstructure is an amorphous solid.
 18. A microelectromechanical system(MEMS) device, comprising: a sensing circuit disposed on a firstsemiconductor substrate; an interlayer dielectric (ILD) structuredisposed over the first semiconductor substrate and the sensing circuit,wherein the ILD structure at least partially defines a cavity; aninterconnect structure embedded in the ILD structure, wherein theinterconnect structure is electrically coupled to the sensing circuit; asecond semiconductor substrate bonded to the first semiconductorsubstrate, wherein the second semiconductor substrate is bonded to thefirst semiconductor substrate via a bonding structure that contacts boththe ILD structure and the second semiconductor substrate, wherein thebonding structure at least partially defines the cavity, and wherein thesecond semiconductor substrate comprises a movable mass disposed betweenopposite sidewalls of the cavity; an electrode disposed between the ILDstructure and the movable mass, wherein the electrode is electricallycoupled to the interconnect structure and comprises a silicon-basedsemiconductor; a first anti-stiction structure disposed between the ILDstructure and the movable mass, wherein the first anti-stictionstructure is spaced from the electrode, and wherein the firstanti-stiction structure comprises the silicon-based semiconductor andone or more outgassing species, wherein the first anti-stictionstructure is partially embedded in the ILD structure and partiallydisposed over the ILD structure; and a second anti-stiction structuredisposed between the ILD structure and the movable mass, wherein thesecond anti-stiction structure is spaced from the electrode, wherein theelectrode is disposed laterally between the first anti-stictionstructure and the second anti-stiction structure, and wherein the secondanti-stiction structure comprises the silicon-based semiconductor andthe one or more outgassing species.
 19. The MEMS device of claim 18,wherein the first anti-stiction structure has a first upper surfacedisposed beneath an uppermost surface of the ILD structure and a secondupper surface that is disposed over the uppermost surface of the ILDstructure.
 20. The MEMS device of claim 18, wherein the firstanti-stiction structure and the second anti-stiction structure areamorphous solids.